ASTM E1181 PDF

Purchase your copy of ASTM E – 02() as a PDF download or hard copy directly from the official BSI Shop. All BSI British Standards. Find the most up-to-date version of ASTM E at Engineering ASTM E – E – 02 The test methods provide for reporting of specic, distinctive informati.

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Current results may be erased by clicking on the “Erase Current Results” button. Compare such gures with eyepiece or projected images from a microscope, or with photomicrographs. D1181 Measuring and Referee Procedures are more difficult to apply, but offer greater accuracy. An example photomicrograph of a cross-section condition appears in Fig. For instance, banding present in a given specimen may not be easily recognizable in a transverse orientation.

However, those grain size and area fraction values are determined by examination of the entire area of the specimen, not by examination only of the eld shown in the photomicrograph. Begin by manually outlining all of the areas occupied by one of the distinct grain sizes aztm a given image, either on a transparent overlay placed over the projected image, or directly on the photomicrograph.

If this is not practical, ashm the estimation procedure to as much of the specimen as is reasonable, but recognize that, by not sampling all of the specimen area, some undened bias may be introduced into the estimate.

An arbitrary division was made between the two distinct distributions of grain sizes. The operator may edit individual images allowing accurate measurements to be made even on difficult samples. An example photomicrograph of the necklace condition appears in Fig. Use one of the procedures from 8.

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ASTM E1181 – 02(2015)

Signicance and Use 5. An example photomicrograph of the wide-range condition appears in Fig. Your comments will receive careful consideration at a meeting of the responsible technical committee, which you may attend. The Planimetric Procedure of E does not lend itself to determination of grain size in distinct small areas, and so should not be used.

The area fraction occupied by the ne grain was calculated as the total intercept length in the ne grain region Apply this practice to projected images from a microscope, or to photomicrographs.

Next apply a regular two-dimensional grid to the outlined image. It is the responsibility of the user of this standard to consult appropriate safety and health practices and determine the applicability of regulatory limitations prior to its use. Asm of topological duplex grain sizes include: If additional traverses can be made, they will improve the precision of the nal area fraction estimate. If duplex grain size is suspected in a product too large to be polished and etched as a single specimen, macroetching should be considered as a first step in evaluation.

Sampling and Test Specimens 7. For the coarse grain size, the number of intercepts totaled 13, and the intercept length totaled A further example appears in Fig. An example of such a histogram is shown in Fig. The data in this example were gathered from that photomicrograph, using the procedure of 8. One, the Direct Measurement Procedure see 8. Estimate the area fraction for the grain size being evaluated as the total of the areas of the outlined regions, divided by the total image area.

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The test grid consists of a square network of grid lines, with a recommended interline spacing of 5 mm.

For example, averaging two distinctly different grain sizes may result in reporting a size that does not actually exist anywhere in the specimen. If duplex grain size is suspected in a product too large to be polished and etched as a single specimen, macroetching should be considered as a rst step in evaluation. However, the test methods described here for area fraction estimation may be of use in describing duplex grain structures. The layer depth of 3. E — 02 The test methods provide for reporting of specic, distinctive information for each type of duplex grain size.

This comparison chart is shown in Fig.

Standard test methods for characterizing duplex grain sizes – CERN Document Server

No other units of measurement are included in this standard. And, as an alternative, the test methods offer a procedure for statistically determining the distribution of all the grain sizes present in a duplex grain size specimen.

Measures grain boundary intercept distances or individual grain areas. Accordingly, the longitudinal orientation is recommended, with one exception.

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